nanoscale characterization of surfaces and interfaces, 1994, p.177

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nanoscale characterization of surfaces and interfaces, 1994, p.177

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[...]... primary area of focus has been the characterization of the semiconductorto-metal transition using ultrathin alkali-metal films on Si and GaAs surfaces with an array of complementary experimental techniques Currently, his work extends to vibrational spectroscopy of semiconductor and polymer surfaces, variable-temperature STWSTS of semiconductor interfaces, and the characterization of the geometric and electronic... structures (Sumki et al., 1992) 12 Nanoscale Characterization of Surfaces and Interfaces races, are of the order of 1 pm in width Annealing below T, results in the formation of a large number of sub-step-bands, each several monatomic steps high These make up the step-band, and the density of sub-steps is higher in the middle than on the sides At the edges, a curvature of the terraces is observed Annealing... Transfer of Atoms and Atom Clusters Between Tip and Sample Tip-Induced Lateral Motion of Atoms on Surfaces Nanoscale Modification by Tip-Induced Local Electron-Stimulated Desorption Nanoscale Chemical Modification High-Temperature Nanofabrication Nanoscale Surface Modification Using the AFM Towards Nanoscale Devices Spin-offs of STM - Non-Contact Nanoscale Probes... the experimental study of bulk solids is the characterization of atomic structure Such information is used to provide a link between geometric structure and the other physical properties of a solid Building upon advances in the experimental and theoretical understanding of the bulk, surfaces and interfaces have been intensively studied in recent years because of their fundamental and technological importance... vibrational and electronic structure of metal, semiconductor, and polymer interfaces with EELS, Photoelectron Spectroscopy, and Low Energy Electron Diffraction As a member of the faculty of the Department of Physics and Atmospheric Science at Drexel University since 1984, Professor DiNardo, along with his students, has instituted a program to study the properties of semiconductor surfaces and metal-semiconductor... Figure 19 (a) Comparison of the calculated density of states as given by the function (dI/dV)/(I/V) for a tip of constant state density and (dotted) a surface with constant state density and (solid) a surface describing the density of states of Ca (b) The deviations of peak positions of the dl/dV (dashed) and (dI/dV)/(I/V) (solid) with respect to the actual maxima of the density of states (Lang, 1986)... laterally-shifted image of the unoccupied orbitals at Ga sites (Feenstra et al., 1987b) 10 Nanoscale Characterization of Surfaces and Interfaces Figure 5 (a) STM image of an array of 100 nm high quantum dots on GaAs; (b) STM image of a compact disc surface (Denley, 1900) array on GaAs, are each separated by -300nm, and are -100nm in height The second example shows the surface of a compact disc over... Left Blank Biography Professor DiNardo is Associate Professor of Physics at Drexel University and Adjunct Associate Professor of Materials Science and Engineering at the University of Pennsylvania He received his Ph D in Physics in 1982from the University of Pennsylvania His dissertation involved the use of Electron Energy Loss Spectroscopy (EELS) to study the vibrational structure of adsorbate-metal systems... first tunneling sub-band dominates the conductance Density of' States Effects The effect of electrode densities of states on tunneling images and their spectroscopic signatures was explored by the consideration of the spatial dependence of the tunneling current between a single atom and a planar surface (Lang, 1985) and variations thereof (Lang, 1986, 1987a) The electrodes consisted of an alkali atom... interfaces, and the characterization of the geometric and electronic structure of diamond films with STM and AFM This Page Intentionally Left Blank Nanoscale Characterization of Surfaces and Interfaces N John DiNardo Department of Physics and Atmospheric Science Drexel University Philadelphia PA U.S.A List of Symbols and Abbreviations 1 Introduction . vibrational spectroscopy of semiconductor and polymer surfaces, variable-temperature STWSTS of semiconductor interfaces, and the characterization of the geometric and electronic structure of diamond. vacuum underpotential deposition ultraviolet photoelectron spectroscopy valence band maximum wavefunction X-ray photoelectron spectroscopy 6 Nanoscale Characterization of Surfaces and Interfaces. DiNardo This Page Intentionally Left Blank Biography Professor DiNardo is Associate Professor of Physics at Drexel University and Adjunct Associate Professor of Materials Science and Engineering

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Mục lục

  • Nanoscale Characterization of Surfaces and Interfaces

    • Nanoscale Characterization of Surfaces and Interfaces

    • List of Symbols and Abbreviations

    • 1 Introduction

    • 2 Scanning Tunneling Microscopy (STM)

      • 2.1 Historical Perspective

      • 2.2 Theory

        • 2.2.1 Electron Tunneling and STM Imaging

        • 2.2.2 Scanning Tunneling Spectroscopy (STS)

        • 2.2.3 Inelastic Tunneling Spectroscopy

        • 2.2.4 Ballistic Electron Emission Microscopy (BEEM)

        • 2.3 Instrumentation

          • 2.3.1 Microscope Design: STM Heads

          • 2.3.2 Tips

          • 2.3.3 Vibration and Shock Isolation

          • 2.3.4 Electronics

          • 2.3.5 Microcomputer Control

          • 2.4 Semiconductor Surfaces

            • 2.4.1 Si(111)

            • 2.4.2 Si(100)

            • 2.4.3 GaAs(110)

            • 2.4.4 Photoinduced Processes

            • 2.5 Metal–Semiconductor Interfaces

              • 2.5.1 Alkali­Metal–Semiconductor Interfaces

              • 2.5.2 Growth of Trivalent Metals on Si(001)

              • 2.5.3 Ambiguities in Structural Determinations

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